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Pubblication Year: [All years]   2002  2003  2004  2005  2006  2007  2008  2009  2010  2011  2012  2013  2014  2015  2016  2017  2018  2019  2020  2021  2022  2023 
Tipology [All types]  Tech. report2  Contr. inter. meet2 
interest field: [All fields]  Instrumental4 
Salmaso, B. e coautori   : [ All authors ]  Basso, S  Negri, R  Pareschi, G  Raimondi, L  Salmaso, B  Spiga, D  Tagliaferri, G 

    OAB Authors only     The list is ordered by I.F. in decreasing direction.
Documents in archives: 2   -   Author: Salmaso, B
1/1 pag.
    Totals
  • ∑Authors OAB/Tot.: 7 / 21
  • Percentage OAB_Authors: 33.33%
  • ∑citations: 0
  • ∑I.F.: 0
  • ∑ I.F. / n. publications: 0

7. TECHNICAL REPORTS

Reflectivity and stress characterization of W/Si and Pt/C multilayer samples for the New Hard X-ray Mission phase B development

Spiga, D. , Raimondi, L., Salmaso, B. , Negri, R.

2010, INAF/OAB internal report 03/2010
X-ray tests at PANTER on the TDM2 optic prototype for the New Hard X-ray Mission

Spiga, D. , Raimondi, L., Salmaso, B. , Valsecchi, G., Orlandi, A., Borghi, G., Binda, R., Basso, S. , Borrelli, D., Marioni, F., Ferretti, L., et al.

2010, INAF/OAB internal report 06/2010